Difference between revisions of "Projects:ThicknessSlicer3Module"

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  Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]]
 
  Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]]
  
'''Objective'''  
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[[Image:ThicknessGUI.png|left|thumb|300px|Automatically generated GUI of the thickness Slicer 3 module.]]
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'''Objectives'''  
  
 
Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data).
 
Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data).
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'''Progress'''
 
'''Progress'''
  
Finished an initial implementation.  
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Finished an initial implementation.  
  
'''Key Investigators:
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'''Key Investigators'''
'''
 
*BWH: Marc Niethammer, Sylvain Bouix
 
*Isomics: Steve Pieper.
 
  
''Slides from the programming week''
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* BWH: Marc Niethammer, Sylvain Bouix
[[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt| 4-block PPT Jan 2007]]
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* Isomics: Steve Pieper
  
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'''Links'''
  
[[Image:ThicknessGUI.png|left|thumb|300px|Automatically generated GUI of the thickness Slicer 3 module.]]
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Project Week Results: [[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt|Jan 2007]]

Revision as of 13:32, 4 September 2007

Home < Projects:ThicknessSlicer3Module

Thickness Slicer 3 Module

Back to NA-MIC_Collaborations
Automatically generated GUI of the thickness Slicer 3 module.

Objectives

Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.

Progress

Finished an initial implementation.

Key Investigators

  • BWH: Marc Niethammer, Sylvain Bouix
  • Isomics: Steve Pieper

Links

Project Week Results: Jan 2007