Difference between revisions of "Projects:ThicknessSlicer3Module"
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Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]] | Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]] | ||
− | ''' | + | [[Image:ThicknessGUI.png|left|thumb|300px|Automatically generated GUI of the thickness Slicer 3 module.]] |
+ | |||
+ | '''Objectives''' | ||
Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). | Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). | ||
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'''Progress''' | '''Progress''' | ||
− | + | Finished an initial implementation. | |
− | '''Key Investigators | + | '''Key Investigators''' |
− | ''' | ||
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− | |||
− | + | * BWH: Marc Niethammer, Sylvain Bouix | |
− | + | * Isomics: Steve Pieper | |
+ | '''Links''' | ||
− | [[ | + | Project Week Results: [[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt|Jan 2007]] |
Revision as of 13:32, 4 September 2007
Home < Projects:ThicknessSlicer3ModuleThickness Slicer 3 Module
Back to NA-MIC_Collaborations
Objectives
Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.
Progress
Finished an initial implementation.
Key Investigators
- BWH: Marc Niethammer, Sylvain Bouix
- Isomics: Steve Pieper
Links
Project Week Results: Jan 2007