Difference between revisions of "Projects:ThicknessSlicer3Module"
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Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]] | Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]] | ||
| − | + | = Thickness Slicer 3 Module = | |
| + | |||
| + | A brief description of the project goes right here. | ||
| + | |||
| + | [[Image:ThicknessGUI.png|thumb|300px|Automatically generated GUI of the thickness Slicer 3 module.]] | ||
| + | |||
| + | = Description = | ||
| + | |||
| + | Our objective is to implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). | ||
Thickness measurements are performed using correspondences induced by the solution of Laplace's equation. | Thickness measurements are performed using correspondences induced by the solution of Laplace's equation. | ||
| − | + | ''Progress'' | |
| + | |||
| + | Finished an initial implementation. | ||
| + | |||
| + | = Key Investigators = | ||
| − | + | * BWH: Marc Niethammer, Sylvain Bouix | |
| − | + | * Isomics: Steve Pieper | |
| − | + | Project Week Results: [[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt|Jan 2007]] | |
| − | [[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt| | ||
Latest revision as of 03:31, 28 November 2007
Home < Projects:ThicknessSlicer3ModuleBack to NA-MIC_Collaborations
Thickness Slicer 3 Module
A brief description of the project goes right here.
Description
Our objective is to implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.
Progress
Finished an initial implementation.
Key Investigators
- BWH: Marc Niethammer, Sylvain Bouix
- Isomics: Steve Pieper
Project Week Results: Jan 2007
