Difference between revisions of "Projects:ThicknessSlicer3Module"
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| + | Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]] | ||
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= Thickness Slicer 3 Module = | = Thickness Slicer 3 Module = | ||
| − | + | A brief description of the project goes right here. | |
| − | [[Image:ThicknessGUI.png | + | [[Image:ThicknessGUI.png|thumb|300px|Automatically generated GUI of the thickness Slicer 3 module.]] |
| − | + | = Description = | |
| − | + | Our objective is to implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). | |
Thickness measurements are performed using correspondences induced by the solution of Laplace's equation. | Thickness measurements are performed using correspondences induced by the solution of Laplace's equation. | ||
| − | + | ''Progress'' | |
Finished an initial implementation. | Finished an initial implementation. | ||
| − | + | = Key Investigators = | |
* BWH: Marc Niethammer, Sylvain Bouix | * BWH: Marc Niethammer, Sylvain Bouix | ||
* Isomics: Steve Pieper | * Isomics: Steve Pieper | ||
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Project Week Results: [[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt|Jan 2007]] | Project Week Results: [[Media:2007_Project_Half_Week_ThicknessImageFilter.ppt|Jan 2007]] | ||
Latest revision as of 03:31, 28 November 2007
Home < Projects:ThicknessSlicer3ModuleBack to NA-MIC_Collaborations
Thickness Slicer 3 Module
A brief description of the project goes right here.
Description
Our objective is to implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.
Progress
Finished an initial implementation.
Key Investigators
- BWH: Marc Niethammer, Sylvain Bouix
- Isomics: Steve Pieper
Project Week Results: Jan 2007
