Difference between revisions of "Projects:ThicknessSlicer3Module"

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  Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]]
 
  Back to [[NA-MIC_Collaborations|NA-MIC_Collaborations]]
  
[[Image:ThicknessGUI.png|left|thumb|300px|Automatically generated GUI of the thickness Slicer 3 module.]]
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[[Image:ThicknessGUI.png|thumb|300px|Automatically generated GUI of the thickness Slicer 3 module.]]
  
 
'''Objectives'''  
 
'''Objectives'''  

Revision as of 13:32, 4 September 2007

Home < Projects:ThicknessSlicer3Module

Thickness Slicer 3 Module

Back to NA-MIC_Collaborations
Automatically generated GUI of the thickness Slicer 3 module.

Objectives

Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.

Progress

Finished an initial implementation.

Key Investigators

  • BWH: Marc Niethammer, Sylvain Bouix
  • Isomics: Steve Pieper

Links

Project Week Results: Jan 2007