Engineering:GE

Overview (PI: Jim Miller)

GE is adding technology to ITK to support the needs of NA-MIC, developing a module plugin and scheduling architecture for Slicer3, developing a registration architecture, developing standard radiological review modes, and providing DICOM support for diffusion imaging.

GE Research Projects

	Insight Toolkit (ITK) The Insight Segmentation and Registration Toolkit (ITK) is an open-source software toolkit for performing registration and segmentation. ITK is used as the principal library for image analysis and general image IO in the 3D Slicer. GE Research has extended ITK to support NA-MIC activities by providing probability distributions, tensor pixels, and displacement transforms.
	Slicer3 Plugin Architecture The 3D Slicer platform has been completely reworked through the joint efforts of the NA-MIC community and the BIRN, NAC, NCIGT, and other cooperative grants that leverage the common infrastructure.
	Registration Architecture
	Radiological Review Modes
[[Image: |200px|]]	DICOM Support for Diffusion Imaging
[[Image: |200px|]]	Robust MRI Measurement Tools Funded through the NCBC collaboration grant mechanism, this project brings together researchers from UNC, UPenn, and GE Research to develop deformable registration and MS lesion segmentation tools.