Difference between revisions of "Projects:ThicknessSlicer3Module"
From NAMIC Wiki
Niethammer (talk | contribs) |
|||
| Line 7: | Line 7: | ||
'''Key Investigators:''' | '''Key Investigators:''' | ||
| − | * Marc Niethammer, Sylvain Bouix | + | *BWH: Marc Niethammer, Sylvain Bouix |
| + | *Isomics: Steve Pieper. | ||
'''Slides from the programming week:''' | '''Slides from the programming week:''' | ||
Revision as of 16:32, 3 May 2007
Home < Projects:ThicknessSlicer3ModuleBack to NA-MIC_Collaborations
Objective: Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.
Progress: Finished an initial implementation.
Key Investigators:
- BWH: Marc Niethammer, Sylvain Bouix
- Isomics: Steve Pieper.
Slides from the programming week: 4-block PPT Jan 2007
