Projects:ThicknessSlicer3Module

Back to NA-MIC_Collaborations

Objective: Implement a simple command line module for Slicer 3 enabling thickness measurements on appropriate labelmaps (voxel data). Thickness measurements are performed using correspondences induced by the solution of Laplace's equation.

Progress: Finished an initial implementation.

Key Investigators:

• BWH: Marc Niethammer, Sylvain Bouix
• Isomics: Steve Pieper.

Slides from the programming week: 4-block PPT Jan 2007

Automatically generated GUI of the thickness Slicer 3 module.