Difference between revisions of "2013 Summer Project Week:Deformable registration validation toolkit"
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Image:PW-MIT2013.png|[[2013_Summer_Project_Week#Projects|Projects List]] | Image:PW-MIT2013.png|[[2013_Summer_Project_Week#Projects|Projects List]] | ||
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| + | Image:2013_Summer_Project_Week_Registration_Validation-VisAIRe.gif|VisAIRe registration validation extension in Slicer | ||
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Latest revision as of 03:14, 21 June 2013
Home < 2013 Summer Project Week:Deformable registration validation toolkit
SIFT features
VisAIRe registration validation extension in Slicer
Key Investigators
- MGH: Greg Sharp
- PMH, Toronto: Kevin Wang
- BWH: Andrey Fedorov
Objective
We are developing tools for helping users assess the accuracy of deformable image registration.
Approach, Plan
- Review Andrey Fedorov's qualitative registration review
- Review Chiara Paganelli's feature matching method
- Review Matthew Toews' feature matching method
Progress
- Qualitative review method is very nice, but doesn't offer quantitative method. This method should be very useful for QA of many scans
- Quantitative method is required for algorithm tuning
- Paganelli's method only returned a small-ish number of features. Work is continuing to improve this.
- Toews' method returns many features, but in voxel coordinates, so cannot yet be reviewed.
Delivery Mechanism
This work will be delivered to the NA-MIC Kit as:
- Extension -- python scripted
